Scanning localized viscoelastic image using a quartz crystal resonator combined with an atomic force microscopy

Applied Physics Letters

Volumn 74, Issue 3, 1999, Pages 466-468

  Kim, Jong Min ^a   Chang, Sang Mok ^a   Muramatsu, Hiroshi ^b  

^a Dong A University   (South Korea)

^b SEIKO INSTRUMENTS INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000420121     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123033     Document Type: Article

References (17)

1. Scanning Probe Microscopy and Spectroscopy, edited by R. Wiesendanger (Cambridge University Press, London, 1994).
2. T. Miyatani, M. Horii, A. Rosa, M. Fujihira, and O. Marti, Appl. Phys. Lett. 71, 2632 (1997).
3. C. D. Frisbie, L. F. Rozsnyai, A. Noy, M. S. Wrighton, and C. M. Lieber, Science 265, 2071 (1994).
4. P. Grütter, Y. Liu, P. LeBlanc, and U. Dürig, Appl. Phys. Lett. 71, 279 (1997).
5. E. Betzig and J. K. Trautman, Science 257, 189 (1992).
6. H. Muramatsu, N. Chiba, K. Homma, K. Nakajima, T. Ataka, S. Ohta, A. Kusumi, and M. Hujihira, Appl. Phys. Lett. 66, 3245 (1995).
7. D. A. Buttry and M. D. Ward, Chem. Rev. 92, 1355 (1992).
8. H. Muramatsu, E. Tamiya, and I. Karube, Anal. Chem. 60, 2142 (1988).
9. C. Daly and J. Krim, Phys. Rev. Lett. 76, 803 (1996).
10. K. E. Heusler, A. Grzegorzewski, L. Jäkel, and J. Pietrucha, Ber. Bunsenges, Phys. Chem. 92, 218 (1988).
11. H. Muramatsu and K. Kimura, Anal. Chem. 64, 2502 (1992).
12. S. M. Chang, J. M. Kim, H. Muramatsu, T. Ataka, W. J. Cho, and C. S. Ha, Polymer 37, 3757 (1996).
13. A. Sasaki, A. Katsumata, F. Iwata, and H. Aoyama, Jpn. J. Appl. Phys., Part 2 33, L547 (1994).
14. R. Yamada, S. Ye, and K. Uosaki, Jpn. J. Appl. Phys., Part 2 35, L846 (1996).
15. E. J. Hwang and Y. R. Lim, Bull. Korean Chem. Soc. 17, 39 (1996).
16. H. Muramatsu, A. Egawa, and T. Ataka, J. Electroanal. Chem. 388, 89 (1995).
17. V. M. Mecea, J. Phys. E 22, 59 (1989).