Simultaneous atomic force microscope and quartz crystal microbalance measurements: Interactions and displacement field of a quartz crystal microbalance

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 6 A, 2002, Pages 3974-3977

  Friedt, J M ^a   Choi, K H ^a   Francis, L ^a   Campitelli, A ^a  

^a IMEC   (Belgium)

Author keywords

AFM; Displacement; QCM; Quality factor; Resonance frequency

Indexed keywords

ACOUSTIC WAVES; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRODES; FINITE ELEMENT METHOD; NATURAL FREQUENCIES;

IN-PLANE DISPLACEMENT; OUT-OF-PLANE DISPLACEMENT; QUALITY FACTOR; QUARTZ CRYSTAL MICROBALANCE; QUARTZ RESONATOR;

ATOMIC FORCE MICROSCOPY;

EID: 0036614137     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.3974     Document Type: Article

References (11)