Coexistence of metallic and insulating phases in epitaxial CaRuO 3 thin films observed by scanning microwave microscopy

Applied Physics Letters

Volumn 80, Issue 9, 2002, Pages 1574-1576

  Hyun, S ^a   Cho, J H ^a   Kim, A ^a   Kim, J ^a   Kim, T ^a   Char, K ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE; INSULATING PHASIS; MICROWAVE MICROSCOPY; SCANNING MICROWAVE MICROSCOPES;

ELECTRIC PROPERTIES; EPITAXIAL GROWTH; INSULATION; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; THIN FILMS;

CONDUCTIVE FILMS;

EID: 79956052695     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1448391     Document Type: Article

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