Synthesis and characterization of single-wall carbon nanotube-amorphous diamond thin-film composites

Applied Physics Letters

Volumn 81, Issue 11, 2002, Pages 2097-2099

  Schittenhelm, H ^a   Geohegan, D B ^a   Jellison, G E ^a   Puretzky, A A ^b   Lance, M J ^a   Britt, P F ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON SPECIES; CURRENT-VOLTAGE MEASUREMENTS; DIAMOND THIN FILM; ELECTRICALLY CONDUCTIVE; EX SITU; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; IN-SITU; METALLIC BEHAVIORS; SCRATCH HARDNESS; SCRATCH-RESISTANT; SINGLE-WALL;

AMORPHOUS CARBON; CARBON FILMS; CONDUCTIVE FILMS; DIAMOND FILMS; NANOCOMPOSITE FILMS; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPECTROSCOPIC ELLIPSOMETRY; SYNTHETIC DIAMONDS; THIN FILMS; VAPOR DEPOSITION;

AMORPHOUS FILMS;

EID: 79956040789     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1506947     Document Type: Article

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