Patterning surfaces with colloidal particles using optical tweezers

Applied Physics Letters

Volumn 80, Issue 25, 2002, Pages 4828-4830

  Hoogenboom, J P ^a   Vossen, D L J ^a   Faivre Moskalenko, C ^a   Dogterom, M ^a   Van Blaaderen, A ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SURFACE MODIFICATION; COLLOIDAL PARTICLE; CRITICAL POINT DRYING; METALLO-DIELECTRIC PARTICLES; TWO-DIMENSIONAL PATTERNS;

CHEMICAL MODIFICATION; COLLOIDS; CRYSTAL GROWTH; TWO DIMENSIONAL;

OPTICAL TWEEZERS;

EID: 79956039256     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1488690     Document Type: Article

References (25)

1. A. van Blaaderen, MRS Bull. 23, 39 (1998). mbu MRSBEA 0883-7694
2. Y. Lu, Y. D. Yin, and Y. N. Xia, Adv. Mater. 13, 34 (2001). amt ADVMEW 0935-9648
3. S. A. Maier, M. L. Brongersma, P. G. Kik, S. Meltzer, A. A. G. Requicha, and H. A. Atwater, Adv. Mater. 13, 1501 (2001). amt ADVMEW 0935-9648
4. M. J. Hostetler and R. W. Murray, Curr. Opin. Colloid Interface Sci. 2, 42 (1997). coi COCSFL
5. A. N. Shipway, E. Katz, and I. Willner, ChemPhysChem 1, 18 (2000). 9dt CPCHFT 1439-4235
6. J. H. Holtz and S. A. Asher, Nature (London) 389, 829 (1997). nat NATUAS 0028-0836
7. C. L. Haynes and R. P. Van Duyne, J. Phys. Chem. B 105, 5599 (2001). bfk JPCBFK 1089-5647
8. F. Burmeister, W. Badowsky, T. Braun, S. Wieprich, J. Boneberg, and P. Leiderer, Appl. Surf. Sci. 145, 461 (1999). asu ASUSEE 0169-4332
9. A. v. Blaaderen, R. Ruel, and P. Wiltzius, Nature (London) 385, 321 (1997). nat NATUAS 0028-0836
10. J. Aizenberg, P. V. Braun, and P. Wiltzius, Phys. Rev. Lett. 84, 2997 (2000). prl PRLTAO 0031-9007
11. K. M. Chen, X. Jiang, L. C. Kimerling, and P. T. Hammond, Langmuir 16, 7825 (2000). lan LANGD5 0743-7463
12. X. M. Lin, R. Parthasarathy, and H. M. Jaeger, Appl. Phys. Lett. 78, 1915 (2001). apl APPLAB 0003-6951
13. S. Ito, H. Yoshikawa, and H. Masuhara, Appl. Phys. Lett. 78, 2566 (2001). apl APPLAB 0003-6951
14. J. Won, T. Inaba, H. Masuhara, H. Fujiwara, K. Sasaki, S. Miyawaki, and S. Sato, Appl. Phys. Lett. 75, 1506 (1999). apl APPLAB 0003-6951
15. H. T. Miyazaki, H. Miyazaki, K. Ohtaka, and T. Sato, J. Appl. Phys. 87, 7152 (2000). jap JAPIAU 0021-8979
16. C. Mio and D. W. M. Marr, Langmuir 15, 8565 (1999). lan LANGD5 0743-7463
17. K. Visscher and S. M. Block, in Methods in Enzymology, edited by R. B. Vallee (Academic, San Diego, 1997), Vol. 298, pp. 460-489, and references cited.
18. T. N. Buican, M. J. Smyth, H. A. Crissman, G. C. Salzman, C. C. Stewart, and J. C. Martin, Appl. Opt. 26, 5311 (1987). apo APOPAI 0003-6935
19. A. van Blaaderen and A. Vrij, Langmuir 8, 2921 (1992). lan LANGD5 0743-7463
20. L. M. Liz-Marzan, M. Giersig, and P. Mulvaney, Langmuir 12, 4329 (1996). lan LANGD5 0743-7463
21. D. L. J. Vossen, M. J. A. de Dood, T. van Dillen, T. Zijlstra, E. van der Drift, A. Polman, and A. van Blaaderen, Adv. Mater. 12, 1434 (2000). amt ADVMEW 0935-9648
22. G. Decher, J. D. Hong, and J. Schmitt, Thin Solid Films 210, 831 (1992). tsf THSFAP 0040-6090
23. F. Caruso, Adv. Mater. 13, 11 (2001). amt ADVMEW 0935-9648
24. D. L. J. Vossen, J. P. Hoogenboom, K. Overgaag, and A. van Blaaderen, Mater. Res. Soc. Symp. Proc. 705, Y6.8.1 (2002). 922 MSCJDS 0137-1339
25. K. P. Velikov, C. G. Christova, R. P. A. Dullens, and A. van Blaaderen, Science 296, 5565 (2002). sci SCIEAS 0036-8075