Fluorescence spectroscopy and transmission electron microscopy of the same isolated semiconductor nanocrystals

Applied Physics Letters

Volumn 81, Issue 6, 2002, Pages 1116-1118

  Koberling, Felix ^a   Mews, Alf ^a   Philipp, Günther ^b   Kolb, Ute ^a   Potapova, Inga ^a   Burghard, Marko ^b   Basché, Thomas ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE STRUCTURE; EMISSION WAVELENGTH; FLUORESCENCE EMISSION; FLUORESCENCE PROPERTIES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; OPTICAL MICROSCOPES; SEMICONDUCTOR NANOCRYSTALS; SINGLE DOMAIN PARTICLES; SIZE AND SHAPE; SPECTRAL DIFFUSION; SPECTRAL PROPERTIES; ULTRATHIN SILICON;

FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; NANOCRYSTALS; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 79956038270     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1499221     Document Type: Article

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