Evaluation of thermal parameters of bolometer devices

Applied Physics Letters

Volumn 80, Issue 10, 2002, Pages 1838-1840

  Neuzil, P ^a   Mei, T ^b  

^a INSTITUTE OF MICROELECTRONICS   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN VERIFICATION; ELECTRICAL MEASUREMENT; HIGH-VOLTAGES; MEASUREMENT TECHNIQUES; MICROBOLOMETER; OPERATION CONDITIONS; THERMAL CAPACITANCE; THERMAL CONDUCTANCE; THERMAL PARAMETERS; TIME CONSTANTS;

INFRARED DETECTORS;

BOLOMETERS;

EID: 79956026474     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1458686     Document Type: Article

References (7)

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