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Volumn 81, Issue 15, 2002, Pages 2863-2865
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Real-time determination of the segregation strength of indium atoms in InGaAs layers grown by molecular-beam epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
DECAY CONSTANTS;
GROWTH CONDITIONS;
INDIUM ATOMS;
SEGREGATION COEFFICIENTS;
SEGREGATION STRENGTH;
ATOMS;
INDIUM;
SEMICONDUCTING INDIUM;
SURFACE SEGREGATION;
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EID: 79956026453
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1513182 Document Type: Article |
Times cited : (35)
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References (11)
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