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Volumn 81, Issue 15, 2002, Pages 2863-2865

Real-time determination of the segregation strength of indium atoms in InGaAs layers grown by molecular-beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

DECAY CONSTANTS; GROWTH CONDITIONS; INDIUM ATOMS; SEGREGATION COEFFICIENTS; SEGREGATION STRENGTH;

EID: 79956026453     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1513182     Document Type: Article
Times cited : (35)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.