Combining a scanning near-field optical microscope with a picosecond streak camera: Statistical analysis of exciton kinetics in GaAs single-quantum wells

Applied Physics Letters

Volumn 80, Issue 18, 2002, Pages 3340-3342

  Neuberth, U ^a   Walter, L ^a   Von Freymann, G ^a   Dal Don, B ^a   Kalt, H ^a   Wegener, M ^a   Khitrova, G ^b   Gibbs, H M ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITATION POWER; GAAS; LOW TEMPERATURES; PICOSECONDS; SAMPLE POSITION; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SINGLE QUANTUM WELL;

GALLIUM ARSENIDE; MICROSCOPES; SEMICONDUCTING GALLIUM; STREAK CAMERAS;

SEMICONDUCTOR QUANTUM WELLS;

EID: 79956020823     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1477274     Document Type: Article

References (16)

1. J. B. Stark, U. Mohideen, and R. E. Slusher, Tech. Dig. Ser. Conf. Ed. 16, 82 (1995).
2. S. Smith, N. C. R. Holme, B. Orr, R. Kopelman, and T. Norris, Ultramicroscopy 71, 213 (1998). ult ULTRD6 0304-3991
3. S. Weiss, D. F. Ogletree, D. Botkin, M. Salmeron, and D. S. Chemla, Appl. Phys. Lett. 63, 2567 (1993). apl APPLAB 0003-6951
4. M. Achermann, U. Siegner, L.-E. Wernersson, and U. Keller, Appl. Phys. Lett. 77, 3370 (2000). apl APPLAB 0003-6951
5. G. von Freymann, D. Lüerßen, C. Rabenstein, M. Mikolaiczyk, H. Richter, H. Kalt, T. Schimmel, M. Wegener, K. Okhawa, and D. Hommel, Appl. Phys. Lett. 76, 203 (2000). apl APPLAB 0003-6951
6. G. von Freymann, E. Kurtz, C. Klingshirn, and M. Wegener, Appl. Phys. Lett. 77, 394 (2000). apl APPLAB 0003-6951
7. F. Intonti, V. Emiliani, C. Lienau, T. Elsaesser, V. Savona, E. Runge, R. Zimmermann, R. Nötzel, and K. H. Ploog, Phys. Rev. Lett. 87, 076801 (2001). prl PRLTAO 0031-9007
8. C. Adelmann, J. Hetzler, G. Scheiber, Th. Schimmel, M. Wegener, H. B. Weber, and H. v. Löhneysen, Appl. Phys. Lett. 74, 179 (1999). apl APPLAB 0003-6951
9. G. von Freymann, U. Neuberth, M. Deubel, M. Wegener, G. Khitrova, and H. M. Gibbs, Phys. Rev. B (unpublished).
10. H. F. Hess, E. Betzig, T. D. Harris, L. N. Pfeifer, and K. W. West, Science 264, 822 (1994). sci SCIEAS 0036-8075
11. A. Zrenner, L. V. Butov, M. Hagn, G. Abstreiter, G. Böhm, and G. Weimann, Phys. Rev. Lett. 72, 3382 (1994). prl PRLTAO 0031-9007
12. U. Bockelmann, W. Heller, A. Filoramo, and P. Roussignol, Phys. Rev. B 55, 4456 (1997). prb PRBMDO 0163-1829
13. J. Martinez-Pastor, A. Vinattieri, L. Carraresi, M. Colocci, P. Roussignol, and G. Weimann, Phys. Rev. B 47, 10456 (1993). prb PRBMDO 0163-1829
14. S. D. Baranovskii, R. Eichmann, and P. Thomas, Phys. Rev. B 58, 13081 (1998). prb PRBMDO 0163-1829
15. E. Runge and R. Zimmermann, Phys. Status Solidi B 221, 269 (2000). psb PSSBBD 0370-1972
16. K. Leosson, J. R. Jensen, J. M. Hvam, and W. Langbein, Phys. Status Solidi B 221, 49 (2000). psb PSSBBD 0370-1972