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Applied Physics Letters

Volumn 80, Issue 14, 2002, Pages 2586-2588

Microscopic surface photovoltage spectroscopy

(4) Saraf, S a Shikler, R a Yang, J a Rosenwaks, Y a

a TEL AVIV UNIVERSITY (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONTACT POTENTIAL DIFFERENCE; ILLUMINATION SYSTEM; KELVIN PROBE FORCE MICROSCOPES; MICROSCOPIC SURFACE; SAMPLE SURFACE; SPATIAL RESOLUTION; SUBMICROMETERS; SURFACE PHOTOVOLTAGE SPECTRUM;

ATOMIC FORCE MICROSCOPY; SPECTROSCOPIC ANALYSIS;

SURFACE PROPERTIES;

EID: 79955999552 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1468275 Document Type: Article

Times cited : (17)

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