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Volumn 80, Issue 24, 2002, Pages 4546-4548
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Anti-domain-free GaP, grown in atomically flat (001) Si sub-μm-sized openings
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANTIPHASE DOMAIN BOUNDARY;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
LOW TEMPERATURES;
MONOCRYSTALLINE;
SELECTIVE-AREA EPITAXY;
SI(0 0 1);
GALLIUM ALLOYS;
NANOCRYSTALS;
OPTICAL PROPERTIES;
SCANNING ELECTRON MICROSCOPY;
SILICON;
TRANSMISSION ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 79955999172
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1485311 Document Type: Article |
Times cited : (9)
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References (9)
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