Preferential site distribution of dilute Pt and Ta in CoCr-based films: An extended x-ray absorption fine structure study

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 2912-2917

  Kemner, K M ^a,e   Harris, V G ^a   Elam, W T ^a   Feng, Y C ^a,f   Laughlin, D E ^b   Woicik, J C ^c   Lodder, J C ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d UNIVERSITY OF TWENTE   (Netherlands)

^e ARGONNE NATIONAL LABORATORY   (United States)

^f Headway Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002949605     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366124     Document Type: Article

References (26)

1. C. W. Chen, J. Mater. Sci. 29, 3125 (1991).
2. S. Iwasaki and K. Ouchi, IEEE Trans. Magn. 14, 849 (1978).
3. J. C. Lodder, in High Density Digital Recording, NATO ASI Series, edited by K. H. J. Buschow, G. J. Long, and F. Grandjean (Kluwer, Dordrecht, 1995), Vol. 229, pp. 161-197.
4. Y. Shen, D. E. Laughlin, and D. N. Lambeth, J. Appl. Phys. 76, 8167 (1994).
5. T. Yogi and T. A. Nguyen, IEEE Trans. Magn. 29, 307 (1993).
6. M. R. Kim, S. Guruswamy, and K. E. Johnson, IEEE Trans. Magn. 29, 3673 (1993).
7. K. M. Kemner, V. G. Harris, W. T. Elam, and C. J. Lodder, IEEE Trans. Magn. 30, 4017 (1994).
8. K. Yoshida, H. Kakibayashi, and H. Yasuoka, Mater. Res. Soc. Symp. Proc. 232, 47 (1991).
9. Y. Maeda and M. Takahashi, J. Appl. Phys. 68, 4751 (1990).
10. Y. Yahisa, K. Kimoto, K. Usamik, Y. Matsuda, J. Inagaki, K. Furusawa, and S. Narishige, IEEE Trans. Magn. 31, 2836 (1995).
11. T. Chen and T. Yamashita, IEEE Trans. Magn. 24, 2700 (1988).
12. T. Yogi, T. A. Nguyen, S. E. Lambert, G. L. Gorman, and G. Castillo, IEEE Trans. Magn. 26, 1578 (1990).
13. D. J. Rogers, Y. Maeda, and K. Takei, IEEE Trans. Magn. 30, 3972 (1994)
14. J. Nakai, E. Kusomoto, M. Kuwabara, T. Miyamot, M. R. Visokay, K. Yoshikawa, and E. Itayama, IEEE Trans. Magn. 30, 3969 (1994).
15. P. Glijier, J. Sivertsen, and J. Judy, J. Appl. Phys. 73, 5563 (1993).
16. A. Erbil, G. S. Cargill III, R. Frahm, and R. F. Boehme, Phys. Rev. B 37, 2450 (1988).
17. K. M. Kemner, J. Kropf, and B. A. Bunker, Rev. Sci. Instrum. 65, 3667 (1994).
18. It is important to note that these samples were not initially grown in order to perform Cr K-edge x-ray absorption experiments on them. A Cr buffer layer between the CoCrPt magnetic film and the Corning glass was used to provide a smoother film surface for earlier recording performance improvement studies.
19. D. E. Sayers and B A. Bunker, in X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES, edited by D. C. Koningsberger and R. Prins, (Wiley, New York, 1988), p. 211.
20. 2, values used as inputs to simulate the Co and Cr XAFS data were 0.85, and the value of the inputs used to simulate the Pt and Ta XAFS data were 0.80.
21. For a detailed discussion of the qualitative features of Fourier transformed EXAFS data that are indicative of body center cubic (bcc), face center cubic (fcc), and hexagonal close-packed (hcp) structures, see: K. M. Kemner, W. T. Elam, V. G. Harris, Y. U. Idzerda, and J. A. Wolf, J. Vac. Sci. Technol. B 14, 3207 (1996).
22. K. M. Kemner, V. G. Harris, W. T. Elam, Y. C. Feng, D. E. Laughlin, and J. C. Woicik, IEEE Trans. Magn. 31, 2806 (1995).
23. 2) relative to its value for the best fit of the experimental data. For further details concerning fits to the Ta edge data, see Ref. 22.
24. V. G. Harris, W. T. Elam, N. C. Koon, and F. Hellman, Phys. Rev. B 49, 3637 (1994).
25. Binary Alloy Phase Diagrams Vol. II, edited by T. B. Massalski (ASM International, 1990), PP. 1225, 1226, 1244, 1245, 1313-1316, 1338-1340.
26. C. H. Hwang, Y. S. Park, P. W. Jang, and T. D. Lee, IEEE Trans. Magn. 29, 3733 (1993).