Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering

Applied Physics Letters

Volumn 75, Issue 16, 1999, Pages 2503-2505

  Chow, G M ^a   Goh, W C ^a   Hwu, Y K ^b   Cho, T S ^c   Je, J H ^c   Lee, H H ^d   Kang, H C ^d   Noh, D Y ^d   Lin, C K ^e   Chang, W D ^f  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF PHYSICS   (Taiwan)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

^d Gwangju Institute of Science and Technology (GIST)   (South Korea)

^e FENG CHIA UNIVERSITY   (Taiwan)

^f NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001560658     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125062     Document Type: Article

References (12)

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