-
1
-
-
0005985130
-
-
jaJAPIAU 0021-8979
-
S. J. Pearton, J. C. Zolper, R. J. Shul, and F. Ren, J. Appl. Phys. 86, 1 (1999). jap JAPIAU 0021-8979
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 1
-
-
Pearton, S.J.1
Zolper, J.C.2
Shul, R.J.3
Ren, F.4
-
5
-
-
0003588065
-
-
B. E. Foutz, L. E. Eastman, U. V. Bhapkar, and M. S. Shur, Appl. Phys. Lett. 70, 2843 (1997); apl APPLAB 0003-6951
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2843
-
-
Foutz, B.E.1
Eastman, L.E.2
Bhapkar, U.V.3
Shur, M.S.4
-
6
-
-
0032615133
-
-
jaJAPIAU 0021-8979
-
B. E. Foutz, S. K. O'Leary, M. S. Shur, and L. E. Eastman, J. Appl. Phys. 85, 7727 (1999). jap JAPIAU 0021-8979
-
(1999)
J. Appl. Phys.
, vol.85
, pp. 7727
-
-
Foutz, B.E.1
O'Leary, S.K.2
Shur, M.S.3
Eastman, L.E.4
-
7
-
-
34547160497
-
-
Zh. Eks Teor. Fiz 50, 1660 (1966); [, ]. spj SPHJAR 0038-5646
-
I. I. Vosilius and I. B. Levinson, Zh. Eksp. Teor. Fiz 50, 1660 (1966); [ Sov. Phys. JETP 25, 672 (1967)]. spj SPHJAR 0038-5646
-
(1967)
Sov. Phys. JETP
, vol.25
, pp. 672
-
-
Vosilius, I.I.1
Levinson, I.B.2
-
11
-
-
79958215115
-
-
spj SPHJAR 0038-5646
-
E. M. Gershenzon, L. B. Litvak-Gorskaya, R. I. Rabinovich, and E. Z. Shapiro, 90, 248 (1982). spj SPHJAR 0038-5646
-
(1982)
, vol.90
, pp. 248
-
-
Gershenzon, E.M.1
Litvak-Gorskaya, L.B.2
Rabinovich, R.I.3
Shapiro, E.Z.4
-
12
-
-
84941442398
-
-
bst BSTJAN 0005-8580
-
W. Shockley, Bell Syst. Tech. J. 30, 990 (1951). bst BSTJAN 0005-8580
-
(1951)
Bell Syst. Tech. J.
, vol.30
, pp. 990
-
-
Shockley, W.1
-
13
-
-
0003426859
-
-
Wiley, New York
-
Properties of Advanced Semiconductor Materials: GaN, AlN, InN, BN, SIC, SiGe, edited by M. E. Levinshtein, S. L. Rumyantsev, and M. S. Shur (Wiley, New York, 2001).
-
(2001)
Properties of Advanced Semiconductor Materials: GaN, AlN, InN, BN, SIC, SiGe
-
-
Levinshtein, M.E.1
Rumyantsev, S.L.2
Shur, M.S.3
-
14
-
-
79958235849
-
-
O and E does not contain any material parameters
-
O and E does not contain any material parameters.
-
-
-
-
15
-
-
79958226150
-
-
dr(E) dependence presented in Fig. 3(b) can be seen also in Fig. 1(b) of Ref. 4, where the results have been obtained only for GaN. Moreover authors stated that the effect is "apparently related to the material parameters," while we demonstrate an universal character of this behavior
-
dr(E) dependence presented in Fig. 3(b) can be seen also in Fig. 1(b) of Ref. 4, where the results have been obtained only for GaN. Moreover authors stated that the effect is "apparently related to the material parameters," while we demonstrate an universal character of this behavior.
-
-
-
-
16
-
-
0035884081
-
-
prb PRBMDO 0163-1829
-
S. M. Komirenko, K. W. Kim, V. A. Kochelap, and M. A. Stroscio, Phys. Rev. B 64, 113207 (2001). prb PRBMDO 0163-1829
-
(2001)
Phys. Rev. B
, vol.64
, pp. 113207
-
-
Komirenko, S.M.1
Kim, K.W.2
Kochelap, V.A.3
Stroscio, M.A.4
-
17
-
-
0022288246
-
-
edited by L. Reggiani (Springer, Berlin) Ch. 4
-
Y. K. Pozhela, in Hot-Electron Transport in Semiconductors, edited by L. Reggiani (Springer, Berlin, 1985), Vol. 58, Ch. 4, pp. 113-147.
-
(1985)
Hot-Electron Transport in Semiconductors
, vol.58
, pp. 113-147
-
-
Pozhela, Y.K.1
-
19
-
-
0000461326
-
-
jaJAPIAU 0021-8979
-
E. Starikov, P. Shikhtorov, V. Gruzinskas, L. Reggiani, L. L. Varani, J. C. Vaissiere, and J. H. Zhao, J. Appl. Phys. 89, 1161 (2001). jap JAPIAU 0021-8979
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 1161
-
-
Starikov, E.1
Shikhtorov, P.2
Gruzinskas, V.3
Reggiani, L.4
Varani, L.L.5
Vaissiere, J.C.6
Zhao, J.H.7
|