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Applied Physics Letters

Volumn 80, Issue 24, 2002, Pages 4579-4581

Enhanced transparency ramp-type Josephson contacts through interlayer deposition

(5) Smilde, Henk Jan H a Hilgenkamp, Hans a Rijnders, Guus a Rogalla, Horst a Blank, Dave H A a

a UNIVERSITY OF TWENTE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER DEPOSITION; BARRIER THICKNESS; IN-SITU; ION MILLING; JOSEPHSON CONTACTS; JOSEPHSON JUNCTIONS; JUNCTION PROPERTIES; LOW TEMPERATURES; NORMAL-STATE RESISTANCE; THIN INTERLAYERS; TRANSMISSION ELECTRON MICROSCOPY IMAGES;

JOSEPHSON JUNCTION DEVICES; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY;

TRANSPARENCY;

EID: 79955983293 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1485305 Document Type: Article

Times cited : (42)

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