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Volumn 56, Issue , 2010, Pages 8-14
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Characterization of cuin1-xgaxs2 thin films grown under thermal gradient by vacuum thermal evaporation method
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Author keywords
CuIn1 xgaxS2; Morphological property; Structural property; Thin films
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Indexed keywords
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EID: 79955906728
PISSN: 11143800
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (12)
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