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Volumn , Issue , 2011, Pages 1071-1075

On understanding and driving SiC power JFETs

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL AVAILABILITY; DESIGN STRATEGIES; GATE DRIVES; HIGH-VOLTAGE RATINGS; SWITCHING CHARACTERISTICS; SWITCHING LOSS;

EID: 79955780258     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2011.5744727     Document Type: Conference Paper
Times cited : (11)

References (8)
  • 1
    • 0035305734 scopus 로고    scopus 로고
    • SiC Devices for Advanced Power and High- Temperature Applications
    • April
    • W. Wondrak et al. "SiC Devices for Advanced Power and High- Temperature Applications", IEEE Transactions On Industrial Electronics, Vol. 48, No. 2, April 2001
    • (2001) IEEE Transactions on Industrial Electronics , vol.48 , Issue.2
    • Wondrak, W.1
  • 3
    • 0141866835 scopus 로고    scopus 로고
    • A Comparative Evaluation of New Silicon Carbide Diodes and State-of-the-Art Silicon Diodes for Power Electronic Applications
    • July/August
    • A. Elasser, M. Kheraluwala, M. Ghezzo, R. Steigerwald, N. Evers, J.Kretchmer, and T. P. Chow, "A Comparative Evaluation of New Silicon Carbide Diodes and State-of-the-Art Silicon Diodes for Power Electronic Applications," IEEE Trans. on Industry Applications, vol. 39, no. 4, July/August 2003, pp. 915-921.
    • (2003) IEEE Trans. on Industry Applications , vol.39 , Issue.4 , pp. 915-921
    • Elasser, A.1    Kheraluwala, M.2    Ghezzo, M.3    Steigerwald, R.4    Evers, N.5    Kretchmer, J.6    Chow, T.P.7
  • 5
    • 79955774116 scopus 로고    scopus 로고
    • Refer at
    • Refer SJEP120R100 datasheet at: http://www.semisouth.com/ products/uploads/DS-SJEP120R100-rev1%202.pdf
    • SJEP120R100 Datasheet
  • 7
    • 79955757725 scopus 로고    scopus 로고
    • Optimized Gate Driver for Enhancement-Mode SiC JFET Used in 480VAV SMPS and 1kV PVInverters
    • F. R. Robin Kelley, and Dan Schwob, "Optimized Gate Driver for Enhancement-Mode SiC JFET Used in 480VAV SMPS and 1kV PVInverters," in proceeding of PCIM, Nuremberg , Germany 2009.
    • Proceeding of PCIM, Nuremberg, Germany 2009
    • Kelley, F.R.R.1    Schwob, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.