Piezoelectric stack actuator life test

IEEE Aerospace Conference Proceedings

Volumn , Issue , 2011, Pages

  Sherrit, Stewart ^a   Bao, Xiaoqi ^a   Jones, Christopher M ^a   Aldrich, Jack B ^a   Blodget, Chad J ^a   Moore, James D ^a   Carson, John W ^a   Goullioud, Renaud ^a   Jau, Bruno ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL AND DATA ACQUISITION SYSTEMS; DC VOLTAGE LEVEL; ELECTRICAL CURRENT; FLIGHT CONFIGURATIONS; GAP SENSORS; IMPEDANCE SPECTRUM; LIFE-TESTS; LONG TERM; OPERATIONAL REQUIREMENTS; PATH LENGTH; PIEZOELECTRIC STACK ACTUATORS; POTENTIAL MISSIONS; PRE-STRESSED; PRECISION POSITIONING; PZT STACK; SPACE INTERFEROMETRY MISSION; STRAIN GAUGE; TEST PARAMETERS; TWO-STACK; WAVE FORMS;

DEGRADATION; GAGES; INTERFEROMETRY; NASA; PIEZOELECTRIC ACTUATORS; PIEZOELECTRICITY; REDUNDANCY; SPACE APPLICATIONS;

TESTING;

EID: 79955763624     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2011.5747384     Document Type: Conference Paper

References (15)

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