Extended life PZT stack test fixture

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6929, Issue , 2008, Pages

  Badescu, M ^a   Sherrit, S ^a   Bao, X ^a   Aldrich, J ^a   Bar Cohen, Y ^a   Jones, C ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Extended life test; Piezoelectric stacks; Test fixtures

Indexed keywords

(2+1) DIMENSIONS; (I ,J) CONDITIONS; (PL) PROPERTIES; BREAK DOWN VOLTAGE (BDV); DESIGN MARGINS; DIELECTRIC LOSS FACTORS; ENVIRONMENTAL CONDITIONING; HIGH PRESSURE (HP); HIGH STRESS; HIGH TEMPERATURE (HT); IN ORDER; MULTIPLE MEASUREMENTS; OPERATION RELIABILITY; PIEZOELECTRIC STACKS; PLANETARY MISSIONS; PRECISION POSITIONING; PZT STACK; SOME APPLICATIONS; SPACE ENVIRONMENTS; STRESS LEVELS; TERRESTRIAL APPLICATIONS; TEST CHAMBERS; TEST FIXTURES; TIME PERIODS;

ACTUATORS; ARCHITECTURAL DESIGN; COMPOSITE MATERIALS; COMPOSITE MICROMECHANICS; ELECTRIC CONDUCTIVITY; ENVIRONMENTAL CHAMBERS; IONIZATION OF GASES; LEAKAGE CURRENTS; MECHANICS; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC TRANSDUCERS; PIGMENTS; PRESSURE; STRESSES; TESTING;

FIXTURES (TOOLING);

EID: 44949176776     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.776483     Document Type: Conference Paper

References (7)

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