Analysis of the impedance resonance of piezoelectric stacks

Proceedings of the IEEE Ultrasonics Symposium

Volumn 2, Issue , 2000, Pages 1037-1040

  Sherrit, S ^a   Leary, S P ^a   Bar Cohen, Y ^a   Dolgin, B P ^a   Tasker, R ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b TASI Technical Software   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DEGRADATION; ELASTICITY; ELECTRIC ADMITTANCE; ELECTRIC IMPEDANCE;

PIEZOELECTRIC STACKS;

PIEZOELECTRIC DEVICES;

EID: 0034579322     PISSN: 10510117     EISSN: None     Source Type: Journal    
DOI: 10.1109/ULTSYM.2000.921502     Document Type: Article

References (7)

1. Vibrations of coaxially segmented longitudinally polarized ferroelectric tubes
2. On the theory of segmented electromechanical systems
3. New standard for measurements of certain piezoelectric ceramics
4. Iterative method for accurate determination of the real and imaginary parts of materials coefficients of piezoelectric ceramics
5. Evaluation of the material parameters of piezoelectric materials by various methods
6. Thickness mode material constants of a supported piezoelectric film
7. Field dependence of the complex piezoelectric, dielectric, and elastic constants of Motorola PZT 3203 HD ceramic