Analysis of nanograms of cadmium using a portable total reflection X-ray fluorescence spectrometer

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan

Volumn 97, Issue 2, 2011, Pages 81-84

  Kunimura, Shinsuke ^a   Tee, Deh Ping ^b   Kawai, Jun ^b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

Cadmium; Portable spectrometer; Total reflection x ray fluorescence

Indexed keywords

COUNTING TIME; DETECTION LIMITS; INTENSITY RATIO; INTERNAL STANDARD ELEMENT; NANOGRAMS; PORTABLE SPECTROMETER; SIGNAL-TO-BACKGROUND RATIO; TOTAL REFLECTION X-RAY FLUORESCENCE;

CADMIUM; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; SPECTROMETERS; SPECTROMETRY; X RAYS; YTTRIUM;

X RAY SPECTROMETERS;

EID: 79955755908     PISSN: 00211575     EISSN: None     Source Type: Journal    
DOI: 10.2355/tetsutohagane.97.81     Document Type: Article

References (13)

1. R.Klockenkämper: Total Reflection X-ray Fluorescence Analysis, Wiley, New York, (1997).
2. P.Wobrauschek: X-Ray Spectrom., 36 (2007), 289.
3. A.von Bohlen: Spectrochim. Acta, B64 (2009), 821.
4. P.Wobrauschek, R.Görgl, P.Kregsamer, C.Streli, S.Pahlke, L.Fabry, M.Haller, A.Knochel, and M.Radtke: Spectrochim. Acta, B52 (1997), 901.
5. K.Sakurai, H.Eba, K.Inoue and N.Yagi: Anal. Chem., 74 (2002), 4532.
6. U.Waldschlaeger: Spectrochim. Acta, B61 (2006), 1115.
7. T.Yamada, M.Matsuo, N.Kawahara, Y.Shimizu and M.Mantler: The 12th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods, Trento, June, (2007).
8. R.E.Ayala Jiménez: European Conf. on X-Ray Spectrometry, Alghero, June, (2004).
9. S.Kunimura and J.Kawai: Analyst, 135 (2010), 1909.
10. S.Kunimura and J.Kawai: Adv. X-Ray. Chem. Anal, Jpn., 41 (2010), 29.
11. S.Kunimura, S.Hatakeyama, N. Sasaki, T.Yamamoto and J.Kawai: AIP Conf Proc., 1221 (2010), 24.
12. S.Kunimura and J.Kawai: Bunseki Kagaku, 58 (2009), 1041.
13. S.Kunimura and J.Kawai: Adv. X-Ray Anal., 53 (2010), 180.