In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ spectroscopic ellipsometry measurements

Applied Surface Science

Volumn 257, Issue 16, 2011, Pages 7160-7166

  Kozma, Peter ^a,b   Kozma, Daniel ^c   Nemeth, Andrea ^a   Jankovics, Hajnalka ^b   Kurunczi, Sandor ^a   Horvath, Robert ^a   Vonderviszt, Ferenc ^a,b   Fried, Miklos ^a   Petrik, Peter ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b UNIVERSITY OF PANNONIA   (Hungary)

^c INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

3D layer structure reconstruction; In situ process control; In depth distribution; Mass density profile; Protein layer structure; Spectroscopic ellipsometry

Indexed keywords

CELL IMMOBILIZATION; D REGION; IN SITU PROCESSING; MUTAGENESIS; OPTICAL MULTILAYERS; PROTEINS; SPECTROSCOPIC ELLIPSOMETRY; TANTALUM OXIDES;

COMPUTATIONAL INVESTIGATION; DEPTH DISTRIBUTION; IMMOBILIZATION PROCESS; LAYER STRUCTURES; MASS DENSITIES; PROTEIN LAYER STRUCTURES; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; STATISTICAL PROPERTIES;

IMAGE RECONSTRUCTION;

EID: 79955608501     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.03.081     Document Type: Article

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