Depth elemental imaging of forensic samples by confocal micro-XRF method

Analytical Chemistry

Volumn 83, Issue 9, 2011, Pages 3477-3483

  Nakano, Kazuhiko ^a   Nishi, Chihiro ^a   Otsuki, Kazunori ^b   Nishiwaki, Yoshinori ^b   Tsuji, Kouichi ^a  

^a Osaka Prefecture University   (Japan)

^b Forensic Science Laboratory   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATE AGREEMENT; AUTOMOTIVE PAINTS; CROSS SECTION; DEPTH IMAGE; DEPTH IMAGING; DEPTH PROFILE; FLUORESCENT X RAY; FORENSIC SAMPLES; HETEROGENEOUS DISTRIBUTIONS; HOMOGENEOUS DISTRIBUTION; MICRO-X-RAY; MICRO-XRF; MULTI-LAYERED; MULTI-LAYERED STRUCTURE; NON DESTRUCTIVE; PAINT FRAGMENTS; POLYCAPILLARY X-RAY LENS; SELECTIVE ANALYSIS; SMALL REGION; XRF ANALYSIS;

LEATHER; PAINT; TANNING; X RAYS;

X RAY ANALYSIS;

EID: 79955561086     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac1033177     Document Type: Article

References (30)

1. Suzuki, E. M.; McDermot, M. X. J. Forensic Sci. 2006, 51, 532-547
2. Berendes, A.; Neimke, D.; Schumacher, R.; Barth, M. J. Forensic Sci. 2006, 51, 1085-1090
3. Sano, T.; Suzuki, S. Forensic Sci. Int. 2009, 192, e27-e32
4. Hatzistavros, V. S.; Kallithrakas-Kontos, N. G. J. Radioanal. Nucl. Chem. 2008, 277, 399-404
5. Falcone, R.; Sommariva, G.; Verità, M. Microchim. Acta 2006, 155, 137-140
6. Bush, M. A.; Miller, R. G.; Norrlander, A. L.; Bush, P. J. J. Forensic Sci. 2008, 53, 419-425
7. Thiblin, I.; Lindquist, O.; Rajs, J. J. Forensic Sci. 2000, 45, 16-23
8. Gagliano-Candela, R.; Colucci, A. P.; Napoli, S. J. Forensic Sci. 2008, 53, 321-324
9. Koons, R. D.; Buscaglia, J. J. Forensic Sci. 1999, 44, 496-503
10. Suzuki, Y.; Sugita, R.; Suzuki, S.; Marumo, Y. Anal. Sci. 2000, 16, 1195-1198
11. Montero, S.; Hobbs, A. L.; French, T. A.; Almirall, J. R. J. Forensic Sci. 2003, 48, 1-7
12. Duckworth, D. C.; Morton, S. J.; Bayne, C. K.; Koons, R. D.; Montero, S.; Almirall, J. R. J. Anal. At. Spectrom. 2002, 17, 662-668
13. May, C. D.; Watling, R. J. Forensic Sci. Med. Pathol. 2009, 5, 66-76
14. Watling, R. J.; Lynch, B. F.; Herring, D. J. Anal. At. Spectrom. 1997, 12, 195-203
15. Bridge, C. M.; Powell, J.; Steele, K. L.; Williams, M.; MacInnis, J. M.; Sigman, M. E. Appl. Spectrosc. 2006, 60, 1181-1187
16. Goto, A.; Hokura, A.; Nakai, I. Bunseki Kagaku 2008, 57, 699-706
17. Nakai, I.; Terada, Y.; Ninomiya, T. Meet. Int. Assoc. Forensic Sci., 16th 2002, 29-34
18. Nishiwaki, Y.; Watanabe, S.; Shimoda, O.; Saito, Y.; Nakanishi, T.; Terada, Y.; Nakai, I. J Forensic Sci. 2009, 54, 564-570
19. Worley, C. G.; Wiltshire, S. S.; Miller, T. C.; Havrilla, G. J.; Majidi, V. J Forensic Sci. 2005, 51, 57-63
20. Gibson, W. M.; Kumakhov, M. A. Proc. SPIE 1992, 1736, 172-189
21. Kannigiesser, B.; Malzer, W.; Reiche, I. Nucl. Instrum. Methods Phys. Res. B 2003, 211, 259-264
22. Vincze, L; Vekemans, B.; Brenker, F. E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F. Anal. Chem. 2004, 76, 6786-6791
23. Havrilla, G. J.; Miller, T. Powder Diffr. 2004, 19, 119-126
24. Janssens, K.; Proost, K.; Falkenberg, G. Spectrochim. Acta, Part B 2004, 59, 1637-1645
25. Tsuji, K.; Nakano, K.; Ding, X. Spectrochim. Acta, Part B 2007, 62, 549-553
26. Tsuji, K.; Nakano, K. X-Ray Spectrom. 2007, 36, 145-149
27. Nakano, K.; Tsuji, K. J. Anal. At. Spectrom. 2010, 25, 562-569
28. Tsuji, K.; Yonehara, T.; Nakano, K. Anal. Sci. 2008, 24, 99-103
29. Nakano, K.; Tsuji, K. X-Ray Spectrom. 2009, 38, 446-450
30. Tsuji, K.; Nakano, K. J. Anal. At. Spectrom. 2011, 26, 305-309