Comparison of curvature and x-ray methods for measuring of residual stresses in hard PVD coatings

Materials Science Forum

Volumn 681, Issue , 2011, Pages 455-460

  Lille, H ^a   Koo J ^a   Gregor, A ^b   Ryabchikov, A ^a   Sergejev, F ^b   Traksmaa, R ^b   Kulu, P ^b  

^a ESTONIAN UNIVERSITY OF LIFE SCIENCES   (Estonia)

^b TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

Curvature method; PVD coatings (TiN; Residual stress; TiAlN; TiCN; X ray diffraction

Indexed keywords

ALUMINUM COMPOUNDS; PHYSICAL VAPOR DEPOSITION; RESIDUAL STRESSES; TIN PLATE; TITANIUM NITRIDE; X RAY DIFFRACTION;

COATING DEPOSITION; CURVATURE METHOD; MECHANICAL AND TRIBOLOGICAL PROPERTIES; PHYSICAL VAPOUR DEPOSITION; PVD COATINGS; TIALN; TICN; X-RAY DIFFRACTION TECHNIQUES;

HARD COATINGS;

EID: 79955536952     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.681.455     Document Type: Conference Paper

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