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Volumn 357, Issue 8-9, 2011, Pages 1994-1999

First principles study of oxygen-deficient centers in pure and Ge-doped silica

Author keywords

Ab initio calculations; Defects; Doping; Silica

Indexed keywords

AMORPHOUS SILICON; CALCULATIONS; CRYSTAL ATOMIC STRUCTURE; DEFECTS; DENSITY FUNCTIONAL THEORY; DOPING (ADDITIVES); ELECTRONIC STRUCTURE; OXYGEN VACANCIES; POINT DEFECTS; SILICA;

EID: 79955481162     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2010.12.069     Document Type: Conference Paper
Times cited : (23)

References (42)
  • 1
    • 0002026939 scopus 로고    scopus 로고
    • Defects in SiO2 and Related Dielectrics: Science and Technology
    • D.L. Griscom G. Pacchioni, L. Skuja, D.L. Griscom, Defects in SiO2 and Related Dielectrics: Science and Technology NATO Science Series 2000 Kluwer Dordrecht 117
    • (2000) NATO Science Series , pp. 117
    • Griscom, D.L.1
  • 10
    • 0008849272 scopus 로고    scopus 로고
    • Defects in SiO2 and Related Dielectrics: Science and Technology
    • L. Skuja G. Pacchioni, L. Skuja, D.L. Griscom, Defects in SiO2 and Related Dielectrics: Science and Technology NATO Science Series 2000 Kluwer Dordrecht 73
    • (2000) NATO Science Series , pp. 73
    • Skuja, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.