Radiation effects on silica-based preforms and optical fibersi: Experimental study with canonical samples

IEEE Transactions on Nuclear Science

Volumn 55, Issue 6, 2008, Pages 3473-3482

  Girard, Sylvain ^a   Ouerdane, Youcef ^b   Origlio, Giusy ^b,c   Marcandella, Claude ^a   Boukenter, Aziz ^b   Richard, Nicolas ^a   Baggio, Jacques ^a   Paillet, Philippe ^a   Cannas, Marco ^c   Bisutti, Jean ^a,b   Meunier, Jean Pierre ^b   Boscaino, Roberto ^c  

^a DIF   (France)

^b UNIVERSITÉ JEAN MONNET   (France)

^c UNIVERSITY OF PALERMO   (Italy)

Author keywords

Absorption; Confocal microscopy; EPR; Luminescence; Optical fibers; Point defects; X rays

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; CHLORINE; CONFOCAL MICROSCOPY; DEFECTS; DOPING (ADDITIVES); ELECTRON RESONANCE; ELECTRON SPIN RESONANCE SPECTROSCOPY; FIBERS; FLUORINE; GERMANIUM; GLASS; LIGHT EMISSION; LUMINESCENCE; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; OPTICAL MATERIALS; OPTICAL MICROSCOPY; PARAMAGNETIC RESONANCE; PARAMAGNETISM; POINT DEFECTS; PREFORMING; QUANTUM THEORY; RADIATION; SILICA;

ABSORPTION BANDS; DOPED SAMPLES; DOPING ELEMENTS; DOSE DEPENDENTS; DRAWING PROCESS; ELECTRON PARAMAGNETIC RESONANCES; EPR; EXPERIMENTAL STUDIES; GE-DOPED FIBERS; GERMANOSILICATE GLASS; GLOBAL INFORMATIONS; IN-SITU ABSORPTIONS; LOW DOSE; MCVD PROCESS; RADIATION SENSITIVITIES; RADIATION-INDUCED ABSORPTIONS; RADIATION-INDUCED ATTENUATIONS; SILICA-BASED GLASS; SPECTRAL DOMAINS; SPECTROSCOPIC TECHNIQUES; X-RAY IRRADIATIONS; X-RAYS;

RADIATION EFFECTS;

EID: 58849108209     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2007297     Document Type: Conference Paper

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