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Volumn 109, Issue 7, 2011, Pages

Nonferroelectric contributions to the hysteresis cycles in manganite thin films: A comparative study of measurement techniques

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; FERROELECTRIC FILMS; HYSTERESIS; LANTHANUM COMPOUNDS; MANGANESE COMPOUNDS; MANGANITES; NICKEL COMPOUNDS; POLARIZATION; YTTRIUM COMPOUNDS;

EID: 79955420750     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3555098     Document Type: Conference Paper
Times cited : (117)

References (14)
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  • 2
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    • Scott, J.F.1
  • 3
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    • Why is nonvolatile ferroelectric memory field-effect transistor still elusive?
    • DOI 10.1109/LED.2002.1015207, PII S0741310602053491
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    • Ma, T.P.1    Han, J.-P.2
  • 7
    • 79955433011 scopus 로고    scopus 로고
    • Aixact TF Analyzer Hysteresis Software Version 2.1. (2000)
    • Aixact TF Analyzer Hysteresis Software Version 2.1. (2000).
  • 8
    • 17444425671 scopus 로고    scopus 로고
    • Dynamic leakage current compensation in ferroelectric thin-film capacitor structures
    • DOI 10.1063/1.1897425, 142907
    • R. Meyer, R. Waser, K. Prume, T. Schmitz, and S. Tiedke, Appl. Phys. Lett. 86, 142907 (2005). 10.1063/1.1897425 (Pubitemid 40537408)
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  • 13
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    • Ferroelectrics go bananas
    • DOI 10.1088/0953-8984/20/02/021001, PII S0953898408638412
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    • Scott, J.F.1
  • 14
    • 79955369557 scopus 로고    scopus 로고
    • These artifacts can be easily subtracted in DHM and DLCC methods, since Rs can be evaluated from the slope in the I(V) curve; the time shift caused by L also allows an easy estimate of L
    • These artifacts can be easily subtracted in DHM and DLCC methods, since Rs can be evaluated from the slope in the I(V) curve; the time shift caused by L also allows an easy estimate of L.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.