Lanthanide sensitization in II - VI semiconductor materials: A case study with terbium(III) and europium(III) in zinc sulfide nanoparticles

Journal of Physical Chemistry A

Volumn 115, Issue 16, 2011, Pages 4031-4041

  Mukherjee, Prasun ^a   Shade, Chad M ^a   Yingling, Adrienne M ^a   Lamont, Daniel N ^a   Waldeck, David H ^a   Petoud, Stéphane ^a,b  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b CENTRE DE BIOPHYSIQUE MOLÉCULAIRE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CDS; DORENBOS; ENERGY LEVEL; EXCITATION SPECTRUM; LANTHANIDE EMISSION; LANTHANIDE ION; LANTHANIDES; SEMICONDUCTOR NANOPARTICLES; SEMIEMPIRICAL MODELS; TRAP SITES; ZINC SULFIDE NANOPARTICLES; ZNS NANOPARTICLES;

CADMIUM COMPOUNDS; CADMIUM SULFIDE; CHARGE TRANSFER; ELECTRONIC STRUCTURE; EUROPIUM; GROUND STATE; ION EXCHANGE; LUMINESCENCE; MATERIALS TESTING; NANOPARTICLES; SEMICONDUCTOR MATERIALS; ZINC; ZINC SULFIDE;

TERBIUM;

EUROPIUM; NANOPARTICLE; SULFIDE; TERBIUM; ZINC DERIVATIVE; ZINC SULFIDE;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; ELECTRON; LUMINESCENCE; PARTICLE SIZE; SEMICONDUCTOR;

ELECTRONS; EUROPIUM; LUMINESCENCE; MOLECULAR STRUCTURE; NANOPARTICLES; PARTICLE SIZE; SEMICONDUCTORS; SULFIDES; TERBIUM; ZINC COMPOUNDS;

EID: 79955380067     PISSN: 10895639     EISSN: 15205215     Source Type: Journal    
DOI: 10.1021/jp109786w     Document Type: Article

References (89)

1. Dorenbos, P. J. Phys.: Condens. Matter 2003, 15, 8417-8434
2. Dorenbos, P. J. Lumin. 2004, 108, 301-305
3. Dorenbos, P. J. Lumin. 2005, 111, 89-104
4. Dorenbos, P.; van der Kolk, E. Appl. Phys. Lett. 2006, 89 061122-1 - 061122-3
5. Dorenbos, P.; van der Kolk, E. Opt. Mater. 2008, 30, 1052-1057
6. Dorenbos, P. J. Alloys Compd. 2009, 488, 568-573
7. Richardson, F. S. Chem. Rev. 1982, 82, 541-552
8. Moore, E. G.; Samuel, A. P. S.; Raymond, K. N. Acc. Chem. Res. 2009, 42, 542-552
9. Hildebrandt, N.; Löhmannsröben, H.-G. Curr. Chem. Biol. 2007, 1, 167-186
10. Binnemans, K. Chem. Rev. 2009, 109, 4283-4374
11. Montgomery, C. P.; Murray, B. S.; New, E. J.; Pal, R.; Parker, D. Acc. Chem. Res. 2009, 42, 925-937
12. Bünzli, J.-C. G. Chem. Rev. 2010, 110, 2729-2755
13. Thibon, A.; Pierre, V. C. Anal. Bioanal. Chem. 2009, 394, 107-120
14. White, K. A.; Chengelis, D. A.; Gogick, K. A.; Stehman, J.; Rosi, N. L.; Petoud, S. J. Am. Chem. Soc. 2009, 131, 18069-18071
15. Eliseeva, S. V.; Bünzli, J.-C. G. Chem. Soc. Rev. 2010, 39, 189-227
16. Bünzli, J.-C. G.; Piguet, C. Chem. Soc. Rev. 2005, 34, 1048-1077
17. Carnall, W. T.; Fields, P. R. Lanthanide/Actinide Chemistry; American Chemical Society: Washington, DC, 1967; Vol. 71.
18. Bhargava, R. N. J. Lumin. 1996, 70, 85-94
19. Brennan, J. D.; Capretta, A.; Yong, K.; Gerritsma, D.; Flora, K. K.; Jones, A. Photochem. Photobiol. 2002, 75, 117-121
20. Kim, Y. H.; Baek, N. S.; Kim, H. K. Chem. Phys. Chem. 2006, 7, 213-221
21. Sato, S.; Wada, M. Bull. Chem. Soc. Jpn. 1970, 43, 1955-1962
22. Yang, C.; Fu, L.-M.; Wang, Y.; Zhang, J.-P.; Wong, W.-T.; Ai, X.-C.; Qiao, Y.-F.; Zou, B.-S.; Gui, L.-L. Angew. Chem., Int. Ed. 2004, 43, 5010-5013
23. Chen, Y.; Lu, Z. Anal. Chim. Acta 2007, 587, 180-186
24. Sivakumar, S.; van Veggel, F. C. J. M.; Raudsepp, M. Chem. Phys. Chem. 2007, 8, 1677-1683
25. Xueyuan, C.; Wenqin, L.; Yongsheng, L.; Guokui, L. J. Rare Earths 2007, 25, 515-525
26. Anderson, W. W. Phys. Rev. 1964, 136, A556-A560
27. Palm, J.; Gan, F.; Zheng, B.; Michel, J.; Kimerling, L. C. Phys. Rev. B 1996, 54, 17603-17615
28. Klik, M. A. J.; Gregorkiewicz, T.; Bradley, I. V.; Wells, J.-P. R. Phys. Rev. Lett. 2002, 89 227401-1 - 227401-4
29. Beeby, A.; Clarkson, I. M.; Dickins, R. S.; Faulkner, S.; Parker, D.; Royle, L.; de Sousa, A. S.; Williams, J. A. G.; Woods, M. J. Chem. Soc., Perkin Trans. 2 1999, 493-503
30. Chengelis, D. A.; Yingling, A. M.; Badger, P. D.; Shade, C. M.; Petoud, S. J. Am. Chem. Soc. 2005, 127, 16752-16753
31. Streetman, B. G.; Banerjee, S. Solid State Electronic Devices; 5th ed. Prentice Hall: Upper Saddle River, NJ, 2000.
32. Fuhs, W.; Ulber, I.; Weiser, G.; Bresler, M. S.; Gusev, O. B.; Kuznetsov, A. N.; Kudoyarova, V. K.; Terukov, E. I.; Yassievich, I. N. Phys. Rev. B 1997, 56, 9545-9551
33. Yassievich, I.; Bresler, M.; Gusev, O. J. Non-Cryst. Solids 1998, 226, 192-199
34. Abiko, Y.; Nakayama, N.; Akimoto, K.; Yao, T. Phys. Status Solidi, B 2002, 229, 339-342
35. Kühne, H.; Weiser, G.; Terukov, E. I.; Kusnetsov, A. N.; Kudoyarova, V. K. J. Appl. Phys. 1999, 86, 896-901
36. Tsimperidis, I.; Gregorkiewicz, T.; Bekman, H. H. P. T.; Langerak, C. J. G. M. Phys. Rev. Lett. 1998, 81, 4748-4751
37. Gregorkiewicz, T.; Thao, D. T. X.; Langer, J. M.; Bekman, H. H. P. T.; Bresler, M. S.; Michel, J.; Kimerling, L. C. Phys. Rev. B 2000, 61, 5369-5375
38. Kahng, D. Appl. Phys. Lett. 1968, 13, 210-212
39. Chen, Y. S.; Burgiel, J. C.; Kahng, D. J. Electrochem. Soc.: Solid State Science 1970, 117, 794-797
40. Krupka, D. C. J. Appl. Phys. 1972, 43, 476-481
41. Światek, K.; Godlewski, M. Appl. Phys. Lett. 1990, 56, 2192-2194
42. Światek, K.; Suchocki, A.; Godlewski, M. Appl. Phys. Lett. 1990, 56, 195-197
43. Godlewski, M.; Zakrzewski, A. J.; Ivanov, V. Y. J. Alloys Compd. 2000, 300 - 301, 23-31
44. Światek, K.; Suchocki, A.; Przybylinska, H.; Godlewski, M. J. Cryst. Growth 1990, 101, 435-438
45. Godlewski, M.; Światek, K.; Monemar, B. J. Lumin. 1994, 58, 303-306
46. Przybylinska, H.; Godlewski, M. Phys. Rev. B 1987, 36, 1677-1682
47. Przybylińska, H.; ŚwiaÌtek, K.; StaÌpor, A.; Suchocki, A.; Godlewski, M. Phys. Rev. B 1989, 40, 1748-1755
48. ŚwiaÌtek, K.; Godlewski, M.; Hommel, D. Phys. Rev. B 1990, 42, 3628-3633
49. Chen, L.; Zhang, J.; Lu, S.; Ren, X.; Wang, X. Chem. Phys. Lett. 2005, 409, 144-148
50. Jing-hua, N.; Rui-nian, H.; Wen-lian, L.; Ming-tao, L.; Tian-zhi, Y. J. Phys. D: Appl. Phys. 2006, 39, 2357-2360
51. Dong, L.; Liu, Y.; Zhuo, Y.; Chu, Y. Eur. J. Inorg. Chem. 2010, 2504-2513
52. Hou, S.; Yuen, Y.; Mao, H.; Wang, J.; Zhu, Z. J. Phys. D: Appl. Phys. 2009, 42, 215105
53. Wang, L.; Xu, X.; Yuan, X. J. Lumin. 2010, 130, 137-140
54. Planelles-Aragó, J.; Julián-López, B.; Cordoncillo, E.; Escribano, P.; Pellé, F.; Viana, B.; Sanchez, C. J. Mater. Chem. 2008, 18, 5193-5199
55. Ehrhart, G.; Capoen, B.; Robbe, O.; Beclin, F.; Boy, P.; Turrell, S.; Bouazaoui, M. Opt. Mater. 2008, 30, 1595-1602
56. Yang, H.; Yu, L.; Shen, L.; Wang, L. Mater. Lett. 2004, 58, 1172-1175
57. Chen, W.; Joly, A. G.; Malm, J.-O.; Bovin, J.-O. J. Appl. Phys. 2004, 95, 667-672
58. Qu, S. C.; Zhou, W. H.; Liu, F. Q.; Chen, N. F.; Wang, Z. G.; Pan, H. Y.; Yu, D. P. Appl. Phys. Lett. 2002, 80, 3605-3607
59. Bol, A. A.; van Beek, R.; Meijerink, A. Chem. Mater. 2002, 14, 1121-1126
60. Sun, X. L.; Zhang, G. L.; Tang, G. Q.; Chen, W. J. Chin. Chem. Lett. 1999, 10, 807-810
61. Sun, L.; Yan, C.; Liu, C.; Liao, C.; Li, D.; Yu, J. J. Alloys Compd. 1998, 275 - 277, 234-237
62. Kallmann, H.; Luchner, K. Phys. Rev. 1961, 123, 2013-2019
63. Luchner, K. M.; Kallmann, H. P.; Kramer, B.; Wachter, P. Phys. Rev. 1963, 129, 593-596
64. Meech, S. R.; Phillips, D. C. J. Photochem. 1983, 23, 229-235
65. Petoud, S.; Cohen, S. M.; Bünzli, J.-C. G.; Raymond, K. N. J. Am. Chem. Soc. 2003, 125, 13324-13325
66. Brus, L. E. J. Chem. Phys. 1984, 80, 4403-4409
67. Sooklal, K.; Cullum, B. S.; Angel, S. M.; Murphy, C. J. J. Phys. Chem. 1996, 100, 4551-4555
68. Li, L. S.; Pradhan, N.; Wang, Y.; Peng, X. Nano Lett. 2004, 4, 2261-2264
69. Chen, W.; Wang, Z.; Lin, Z.; Lin, L. J. Appl. Phys. 1997, 82, 3111-3115
70. 2+ emission was also observed by Shu-Man and co-workers in Eu-doped ZnS nanoparticles with a band maximum located at ̃520 nm (Chin. Phys. Lett. 2000, 17, 609 - 611).
71. Fonoberov, V. A.; Balandin, A. A. Appl. Phys. Lett. 2004, 85, 5971-5973
72. Chestnoy, N.; Harris, T. D.; Hull, R.; Brus, L. E. J. Phys. Chem. 1986, 90, 3393-3399
73. Petoud, S.; Muller, G.; Moore, E. G.; Xu, J.; Sokolnicki, J.; Riehl, J. P.; Le, U. N.; Cohen, S. M.; Raymond, K. N. J. Am. Chem. Soc. 2007, 129, 77-83
74. Lakowicz, J. R. Principles of Fluorescence Spectroscopy; 3rd ed.; Springer Scientific: New York, NY, 2006.
75. 3+ resides at almost equal distance from the nanoparticle sensitizing center.
76. Whitney, P. S.; Uwai, K.; Nakagome, H.; Takahei, K. Appl. Phys. Lett. 1988, 53, 2074-2076
77. Takahei, K.; Taguchi, A.; Nakagome, H.; Uwai, K.; Whitney, P. S. J. Appl. Phys. 1989, 66, 4941-4945
78. Thonke, K.; Pressel, K.; Bohnert, G.; Stapor, A.; Weber, J.; Moser, M.; Molassioti, A.; Hangleiter, A.; Scholz, F. Sernicond. Sci. Technol. 1990, 5, 1124-1131
79. Needels, M.; Schlüter, M.; Lannoo, M. Phys. Rev. B 1993, 47, 15533-15536
80. Lazarides, T.; Tart, N. M.; Sykes, D.; Faulkner, S.; Barbieri, A.; Ward, M. D. Dalton Trans. 2009, 3971-3979
81. Pedrini, C.; Bouttet, D.; Dujardin, C.; Belsky, A.; Vasil'ev, A. Proc. Int. Conf. Inorg. Scintillators Their Appl.; Dorenbos, P.; van Eijk, C. W. E., Eds.; Delft University Press: The Netherlands, 1996; p 103.
82. Sato, S. J. Phys. Soc. Jpn. 1976, 41, 913-920
83. Thiel, C. W.; Cruguel, H.; Wu, H.; Sun, Y.; Lapeyre, G. J.; Cone, R. L.; Equall, R. W.; Macfarlane, R. M. Phys. Rev. B 2001, 64 085107-1 - 085107-13
84. Thiel, C. W.; Cruguel, H.; Sun, Y.; Lapeyre, G. J.; Macfarlane, R. M.; Equall, R. W.; Cone, R. L. J. Lumin. 2001, 94/95, 1-6
85. Thiel, C. W.; Sun, Y.; Cone, R. L. J. Mod. Opt. 2002, 49, 2399-2411
86. Jörgensen, C. K. Modern Aspects of Ligand Field Theory; North-Holland Publishing Co.: Amsterdam, 1971.
87. Carnall, W. T.; Fields, P. R.; Rajnak, K. J. Chem. Phys. 1968, 49, 4447-4449
88. Carnall, W. T.; Fields, P. R.; Rajnak, K. J. Chem. Phys. 1968, 49, 4450-4455
89. Chen, W.; Malm, J.-O.; Zwiller, V.; Huang, Y.; Liu, S.; Wallenberg, R.; Bovin, J.-O.; Samuelson, L. Phys. Rev. B 2000, 61, 11021-11024