Defect-related Auger excitation of erbium ions in amorphous silicon

Journal of Non-Crystalline Solids

Volumn 226, Issue 1-2, 1998, Pages 192-199

  Yassievich, Irina ^a   Bresler, Mikhail ^a   Gusev, Oleg ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ELECTRIC EXCITATION; ELECTROLUMINESCENCE; ELECTRON TRANSITIONS; PHONONS; PHOTOLUMINESCENCE; QUENCHING;

DEFECT RELATED AUGER EXCITATION (DRAE) METHODS; MULTIPHONON NONRADIATIVE TRANSITIONS;

ERBIUM;

EID: 0032074342     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(98)00357-3     Document Type: Article

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