Determination of the optimal accelerated burn-in time under Arrhenius-Lognormal distribution assumption

Applied Mathematical Modelling

Volumn 35, Issue 8, 2011, Pages 4023-4030

  Lee, Pei Hsi ^a   Torng, Chau Chen ^b   Lin, Yang Cheng ^b  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^b NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Accelerated burn in test; Arrhenius Lognormal distribution; Genetic algorithm; TFT LCD module

Indexed keywords

ARRHENIUS; BURN-IN; BURN-IN TEST; BURN-IN TIME; COST MODELS; ELECTRONIC PRODUCT; ENVIRONMENTAL STRESS; LOG-NORMAL; LOG-NORMAL DISTRIBUTION; MEAN RESIDUAL LIFE FUNCTIONS; MODEL PARAMETERS; OPTIMAL BURN-IN TIME; STRESS LEVELS; TEMPERATURE LEVEL; TFT-LCDS;

GENETIC ALGORITHMS; OPTIMIZATION; SENSITIVITY ANALYSIS;

THIN FILM TRANSISTORS;

EID: 79955101451     PISSN: 0307904X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apm.2011.02.022     Document Type: Article

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