Mathematical framework for a new microscopic electrical impedance tomography system

Inverse Problems

Volumn 27, Issue 5, 2011, Pages

  Lee, Eunjung ^a   Seo, Jin Keun ^a   Woo, Eung Je ^b   Zhang, Tingting ^a  

^a Yonsei University   (South Korea)

^b Kyung Hee University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL TISSUES; BOUNDARY VOLTAGE DATA; CONDUCTIVITY IMAGE; CROSS-SECTIONAL CONDUCTIVITY; CURRENT INJECTIONS; DATA COLLECTION METHOD; ELECTRICAL IMPEDANCE TOMOGRAPHY; ELECTRODE CONFIGURATIONS; IMAGE RECONSTRUCTION ALGORITHM; INVERSION FORMULA; MATHEMATICAL FRAMEWORKS; MULTIPLE CURRENTS; NUMERICAL SIMULATION; SAMPLE MANIPULATION;

ALGORITHMS; CONTAINERS; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; IMAGE QUALITY; IMAGE RECONSTRUCTION; MICROELECTRODES; TISSUE; VOLTAGE MEASUREMENT;

DIAGNOSTIC RADIOGRAPHY;

EID: 79955063904     PISSN: 02665611     EISSN: 13616420     Source Type: Journal    
DOI: 10.1088/0266-5611/27/5/055008     Document Type: Article

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