Concentration detection of quantum dots in the visible and near-infrared range based on surface plasmon resonance sensor

Materials Letters

Volumn 65, Issue 12, 2011, Pages 1998-2000

  Liu, G Q ^a   Tang, F L ^a   Li, L ^a   Gong, L X ^a   Ye, Z Q ^a  

^a JIANGXI NORMAL UNIVERSITY   (China)

Author keywords

Optical material and property; Semiconductor; Sensor; Thin film

Indexed keywords

ATTENUATED TOTAL REFLECTIONS; CDSE/ZNS; CONCENTRATION VARIATION; CORE-SHELL QUANTUM DOTS; INCIDENT LASER; NEAR INFRARED; OPTICAL MATERIAL AND PROPERTIES; ORGANIC FILMS; QUANTUM DOT; SEMICONDUCTOR; SENSITIVITY ENHANCEMENTS; SPR SENSORS; SURFACE PLASMON RESONANCE SENSOR; SURFACE PLASMONS; VISIBLE AND NEAR INFRARED; VISIBLE RANGE;

INFRARED DEVICES; OPTICAL DATA STORAGE; ORGANIC LASERS; PLASMONS; SEMICONDUCTOR QUANTUM DOTS; SENSORS; SURFACE PLASMON RESONANCE; SURFACES; THIN FILMS;

OPTICAL FILMS;

EID: 79955027594     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2011.03.088     Document Type: Article

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