Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopy

Optics Communications

Volumn 130, Issue 4-6, 1996, Pages 260-266

  Peterlinz, K A ^a,b   Georgiadis, R ^a,b  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

^b Department of Chemistry ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES OF SOLIDS; EXPERIMENTS; OPTICAL VARIABLES MEASUREMENT; RESONANCE; SPECTROSCOPY; THIN FILMS;

DIELECTRIC CONSTANT; SURFACE PLASMON RESONANCE SPECTROSCOPY; TWO-COLOR APPROACH;

OPTICAL RECORDING;

EID: 0030271144     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(96)00238-6     Document Type: Article

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