Temperature-dependent light-output characteristics of GaInN light-emitting diodes with different dislocation densities

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 4, 2011, Pages 947-950

  Chhajed, Sameer ^a   Cho, Jaehee ^a   Schubert, E Fred ^a   Kim, Jong Kyu ^b   Koleske, Daniel D ^c   Crawford, Mary H ^c  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

dislocation density; GaInN; light emitting diodes

Indexed keywords

AMBIENT TEMPERATURES; CHARACTERISTIC TEMPERATURE; CURRENT DEPENDENCE; DISLOCATION DENSITIES; GAINN; HIGH TEMPERATURE; OUTPUT CHARACTERISTICS; OUTPUT POWER; RADIATIVE RECOMBINATION; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT; TEMPERATURE STABILITY; THREADING DISLOCATION DENSITIES;

DIODES; LIGHT EMISSION; TEMPERATURE DISTRIBUTION;

LIGHT EMITTING DIODES;

EID: 79954443124     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026668     Document Type: Article

References (11)

1. J. Hu, L. Yang, and, M. W. Shin, J. Phys. D: Appl. Phys. 41, 035107 (2008).
2. X. A. Cao, E. B. Stokes, P. M. Sandvik, S. F. LeBoeuf, J. Kretchmer, and, D. Walker, IEEE Electron. Device Lett. 23, 535 (2002).
3. M. F. Schubert, S. Chhajed, J. K. Kim, E. F. Schubert, D. D. Koleske, M. H. Crawford, S. R. Lee, A. J. Fischer, G. Thaler, and, M. A. Banas, Appl. Phys. Lett. 91, 231114 (2007).
4. S. R. Lee, A. M. West, A. A. Allerman, K. E. Waldrip, D. M. Follstaedt, P. P. Provencio, D. D. Koleske, and, C. R. Abernathy, Appl. Phys. Lett. 86, 241904 (2005).
5. E. F. Schubert, Light-Emitting Diodes, 2nd edition (Cambridge University Press, Cambridge, UK, 2006).
6. Q. Dai, M. F. Schubert, M. H. Kim, J. K. Kim, E. F. Schubert, D. D. Koleske, M. H. Crawford, S. R. Lee, A. J. Fischer, G. Thaler, and, M. A. Banas, Appl. Phys. Lett. 94, 111109 (2009).
7. Y. Kawakami, Y. Narukawa, K. Omae, Sg. Fujita, and, S. Nakamura, Phys. Status Solidi A 178, 331 (2000).
8. C. Huh, W. J. Schaff, L. F. Eastman, and, S.-J. Park, Proc. SPIE 5187, 330 (2004).
9. J. Cho, E. Yoon, Y. Park, W. J. Ha, and, J. K. Kim, Electron. Mater. Lett. 6, 51 (2010).
10. H. K. Lee, J. S. Yu, and, Y. T. Lee, Phys. Status Solidi A 207, 1497 (2010).
11. M. H. Kim, M. F. Schubert, Q. Dai, J. K. Kim, E. F. Schubert, J. Piprek, and, Y. Park, Appl. Phys. Lett. 91, 183507 (2007).