Microstructural characterization of nanosized ceria powders by X-ray diffraction analysis

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 42, Issue 5, 2011, Pages 1409-1417

  Sen, Ranjan ^a   Das, Siddhartha ^a   Das, Karabi ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CERIA POWDER; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HIGH-ENERGY BALL MILLING; LATTICE PARAMETERS; LATTICE STRAIN; MICRO-STRUCTURAL CHARACTERIZATION; MILLING TIME; NANO-SIZED; NANOCRYSTALLINES; STRAIN ANISOTROPIES; VOLUME-WEIGHTED AVERAGES; WEIGHTED AVERAGES; WILLIAMSON-HALL;

BALL MILLING; CERIUM COMPOUNDS; FIELD EMISSION; FIELD EMISSION MICROSCOPES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MILLING (MACHINING); POWDERS; RIETVELD ANALYSIS; RIETVELD METHOD; SCANNING ELECTRON MICROSCOPY; STATISTICAL METHODS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

CRYSTALLITE SIZE;

EID: 79954431142     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-010-0463-4     Document Type: Article

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