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Volumn 59, Issue 9, 2011, Pages 3410-3421

Deformation mechanisms in micron-sized PST TiAl compression samples: Experiment and model

Author keywords

Compression test; Modelling; Scanning transmission electron microscopy (STEM); Titanium aluminides; Transmission electron microscopy (TEM)

Indexed keywords

AUTOMOTIVE APPLICATIONS; COMPRESSION TESTS; DEFORMATION MECHANISM; DEFORMATION STRUCTURE; DISLOCATION GLIDE; ELECTRON TRANSPARENCY; FLAT PUNCHES; FOCUSED ION BEAM TECHNIQUE; IN-SITU; MECHANICAL TWINNING; MODEL MATERIALS; MODELLING; NOMINAL COMPOSITION; POLYSYNTHETICALLY TWINNED; SCANNING ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SMALL STRAINS; SQUARE CROSS-SECTION; TEM; THERMODYNAMIC MODEL; THIN FOIL; TITANIUM ALUMINIDES;

EID: 79954420755     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.02.016     Document Type: Article
Times cited : (47)

References (50)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.