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Volumn 509, Issue 20, 2011, Pages 6004-6008
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Structural, optical and electrical properties of CuIn5S 8 thin films grown by thermal evaporation method
a
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Author keywords
Annealing; CuIn5S8; Electrical properties; Optical properties; Spinel structure
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Indexed keywords
ABSORPTION COEFFICIENTS;
ANNEALED FILMS;
ANNEALING TEMPERATURES;
AS-DEPOSITED FILMS;
CUBIC SPINEL STRUCTURE;
CUIN5S8;
DIRECT REACTIONS;
ELECTRICAL PROPERTY;
ENERGY DISPERSIVE X-RAY SPECTROSCOPY;
GLASS SUBSTRATES;
HIGH PURITY;
HOT PROBE;
LATTICE PARAMETERS;
N-TYPE SEMICONDUCTORS;
OPTICAL AND ELECTRICAL PROPERTIES;
OPTICAL ENERGY BAND GAP;
OPTICAL TRANSMISSIONS;
PHYSICOCHEMICAL PROPERTY;
POLYCRYSTALLINE SPINEL;
PREFERRED ORIENTATIONS;
QUARTZ TUBES;
SCANNING ELECTRON MICROSCOPES;
SPINEL STRUCTURE;
STOICHIOMETRIC COMPOUND;
SYNTHESIZED MATERIALS;
THERMAL EVAPORATION METHOD;
THERMAL EVAPORATION TECHNIQUE;
THERMAL TREATMENT;
THERMAL-ANNEALING;
XRD STUDIES;
AMORPHOUS FILMS;
ANNEALING;
CHEMICAL PROPERTIES;
ELECTRIC PROPERTIES;
ENERGY DISPERSIVE SPECTROSCOPY;
EVAPORATION;
INDIUM;
LIGHT TRANSMISSION;
PHASE TRANSITIONS;
QUARTZ;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
STRUCTURAL PROPERTIES;
SUBSTRATES;
SULFUR;
THERMAL EVAPORATION;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
X RAY SPECTROSCOPY;
OPTICAL PROPERTIES;
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EID: 79954416611
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2011.02.047 Document Type: Article |
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Times cited : (14)
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References (28)
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