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Volumn 269, Issue 9, 2011, Pages 1003-1006

Interaction of swift ion beams with surfaces: Sputtering of secondary ions from LiF studied by XY-TOF-SIMS

Author keywords

Highly charged ions; Lithium fluoride; Sputtering

Indexed keywords

CLUSTER IONS; CLUSTER SIZES; ELECTRONIC STOPPING; HIGHLY CHARGED IONS; IONIC CLUSTERS; LITHIUM FLUORIDE; MASS DISTRIBUTION; MONO-CRYSTALS; SECONDARY IONS; SWIFT HEAVY IONS; TARGET SURFACE; TIME OF FLIGHT; TOF SIMS; VELOCITY VECTORS;

EID: 79953757049     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.12.062     Document Type: Conference Paper
Times cited : (21)

References (22)
  • 9
    • 46649090141 scopus 로고    scopus 로고
    • Ion Beam Science - Solved and Unsolved Problems
    • S. Klaumünzer Ion Beam Science - Solved and Unsolved Problems Mat. Fys. Medd. Dan. Vid. Selsk 52 2006 293 Peter Sigmund (Ed.)
    • (2006) Mat. Fys. Medd. Dan. Vid. Selsk , vol.52 , pp. 293
    • Klaumünzer, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.