Investigations on the effect of contacts on p-type CdTe DLTS-measurements

Journal of Crystal Growth

Volumn 197, Issue 3, 1999, Pages 586-592

  Scholz, K ^a   Stiens, H ^a   Muller Vogt G ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

DLTS measurements; p Type CdTe

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEPOSITION; OHMIC CONTACTS; SCHOTTKY BARRIER DIODES; SURFACE TREATMENT;

CONTACT METALS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0033514217     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00801-X     Document Type: Article

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