An accurate analytical approximation to the capacitance transient amplitude in deep level transient spectroscopy for fitting carrier capture data

Review of Scientific Instruments

Volumn 79, Issue 9, 2008, Pages

  Lauwaert, J ^a   Van Gheluwe, J ^a   Clauws, P ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749099623     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2977550     Document Type: Article

References (9)

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