Bulk phase two dimensional chiral growth of 6, 13 Pentacenequinone on SiO2

Journal of Applied Physics

Volumn 109, Issue 6, 2011, Pages

  De Marco, P ^a,b   Fioriti, F ^a   Bisti, F ^a   Parisse, P ^a,c   Santucci, S ^a,b   Ottaviano, L ^a,b  

^a UNIVERSITY OF L'AQUILA   (Italy)

^b CNR SPIN ^*  (Italy)

^c SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BULK PHASE; CRITICAL THICKNESS; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; NOMINAL THICKNESS; PREFERENTIAL GROWTH; SI(1 0 0); STRANSKI-KRASTANOV MODE; STRUCTURE AND MORPHOLOGY; TAPPING-MODE ATOMIC FORCE MICROSCOPY; TWO DIRECTIONS;

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; FIELD EMISSION; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; TWO DIMENSIONAL; ULTRATHIN FILMS; X RAY DIFFRACTION;

FILM GROWTH;

EID: 79953647370     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3549833     Document Type: Article

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