Thin and ultra-thin films of nickel phthalocyanine grown on highly oriented pyrolitic graphite: An XPS, UHV-AFM and air tapping-mode AFM study

Surface Science

Volumn 373, Issue 2-3, 1997, Pages 318-332

  Ottaviano, L ^a   Di Nardo, S ^a   Lozzi, L ^a   Passacantando, M ^a   Picozzi, P ^a   Santucci, S ^a  

^a UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

Atomic force microscopy; Graphite; Polycrystalline thin films; Surface structure, morphology, roughness and topography; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DEPOSITION; GRAPHITE; MORPHOLOGY; NICKEL COMPOUNDS; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS; THIN FILMS; ULTRATHIN FILMS; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

NICKEL PHTHALOCYANINE; SURFACE TOPOGRAPHY; ULTRAHIGH VACUUM CONDITIONS;

FILM GROWTH;

EID: 0031104179     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01179-X     Document Type: Article

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