Use of image analysis in DC inclined plane tracking tests of nano and micro composites

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 18, Issue 2, 2011, Pages 365-374

  Rowland, S M ^a   Bruce, G P ^a   Liu, Yuting ^a   Krivda, A ^b   Schmidt, L E ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b ABB SWITZERLAND LTD   (Switzerland)

Author keywords

composites; dc; electrical discharge; erosion; IEC 60587; image analysis; intermittency; nano; tracking

Indexed keywords

COMPOSITES; DC; ELECTRICAL DISCHARGE; IEC 60587; INTERMITTENCY; NANO; TRACKING;

COMPUTER VISION; ELECTRIC DISCHARGES; EROSION; ETHERS; FILLERS; IMAGE ANALYSIS; LEAKAGE CURRENTS; MOISTURE CONTROL; SILICONES; SYNTHETIC RESINS; TESTING;

EPOXY RESINS;

EID: 79953644578     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2011.5739439     Document Type: Article

References (13)

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