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Volumn 638, Issue 1, 2011, Pages 171-175

Anti-contamination device for cryogenic soft X-ray diffraction microscopy

Author keywords

Anti contamination; Cryogenic X ray microscopy; Diffraction microscopy; X ray Imaging

Indexed keywords

ANTI-CONTAMINATION; BIOLOGICAL SPECIMENS; COHERENT X-RAY DIFFRACTION; DEGREE OF STABILITY; DIFFRACTION MICROSCOPY; FAR-FIELD; ICE LAYERS; RESIDUAL WATERS; SOFT MATTER; SOFT X-RAY; VACUUM CHAMBERS; X-RAY DIFFRACTION MICROSCOPY; XRAY IMAGING;

EID: 79953317209     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2011.02.085     Document Type: Article
Times cited : (6)

References (32)
  • 10
    • 0002392403 scopus 로고
    • Prospects for long-wavelength X-ray microscopy and diffraction
    • D. Sayre Prospects for long-wavelength X-ray microscopy and diffraction M. Schlenker, Imaging Processes and Coherence in Physics 1980 Springer-Verlag Berlin 229
    • (1980) Imaging Processes and Coherence in Physics , pp. 229
    • Sayre, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.