Structural stability of transparent conducting films assembled from length purified single-wall carbon nanotubes

Journal of Physical Chemistry C

Volumn 115, Issue 10, 2011, Pages 3973-3981

  Harris, John M ^a   Iyer, Ganjigunte R S ^a   Simien, Daneesh O ^b   Fagan, Jeffrey A ^c   Huh, Ji Yeon ^c   Chung, Jun Young ^c   Hudson, Steven D ^c   Obrzut, Jan ^c   Douglas, Jack F ^c   Stafford, Christopher M ^c   Hobbie, Erik K ^a  

^a NORTH DAKOTA STATE UNIVERSITY   (United States)

^b West Virginia University   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL SURFACES; ELASTOPLASTIC DEFORMATION; FORCE MICROSCOPY; FUNDAMENTAL MODES; IMPEDANCE SPECTROSCOPY; MECHANICAL FLEXIBILITY; MEMBRANE CONDUCTIVITY; POLYMER SUBSTRATE; PRE-STRAIN; SINGLE-WALL CARBON NANOTUBES; SMALL STRAINS; STRAIN DEPENDENCE; STRONGLY NONLINEAR; STRUCTURAL STABILITIES; THIN MEMBRANE; TRANSPARENT CONDUCTING FILMS; TRANSPARENT ELECTRONICS;

CARBON FILMS; CARBON NANOTUBES; CONDUCTIVE FILMS; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRONIC EQUIPMENT; PURIFICATION; STABILITY; STRAIN; TOPOGRAPHY; WALLS (STRUCTURAL PARTITIONS);

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 79953177924     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp200250j     Document Type: Article

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