Study of the influence of dopants on the crystalline perfection of ferroelectric glycine phosphite single crystals using high-resolution X-ray diffraction analysis

Journal of Applied Crystallography

Volumn 44, Issue 2, 2011, Pages 313-318

  Senthil Kumar, Krishnamurthy ^a   Babu, Sridharan Moorthy ^a   Bhagavannarayana, G ^b  

^a ANNA UNIVERSITY   (India)

^b NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

crystal growth from solutions; ferroelectric materials; high resolution X ray diffraction

Indexed keywords

AS-GROWN; COOLING TECHNIQUE; CRYSTALLINE PERFECTION; GLYCINE PHOSPHITES; GROWTH PROCESS; HIGH-RESOLUTION X-RAY DIFFRACTION; INTERSTITIAL POINT DEFECTS; L-PROLINE; LOW-ANGLE TILT; MALACHITE GREEN; RARE-EARTH METALS; RHODAMINE B; ROOM TEMPERATURE; X RAY DIFFRACTOMETERS;

AMINO ACIDS; CADMIUM; CARBONATE MINERALS; CRYSTAL GROWTH FROM SOLUTION; CRYSTALLINE MATERIALS; CRYSTALLIZATION; DIFFRACTION; DOPING (ADDITIVES); DYES; FERROELECTRIC MATERIALS; FERROELECTRICITY; GRAIN BOUNDARIES; GROWTH (MATERIALS); MANGANESE; POINT DEFECTS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

SINGLE CRYSTALS;

EID: 79953061019     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811005140     Document Type: Article

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