Study of effect of thermal annealing on crystalline perfection of bismuth germanate single crystals grown by low thermal gradient Czochralski method

Zeitschrift fur Kristallographie

Volumn 217, Issue 10, 2002, Pages 515-521

  Choubey, A ^a   Bhagavannarayana, G ^a   Shubin, Yu V ^b   Chakraborty, B R ^a   Lal, K ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

^b NIKOLAEV INSTITUTE OF INORGANIC CHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH DERIVATIVE; SILICON;

ANALYTIC METHOD; ARTICLE; CRYSTAL STRUCTURE; MASS SPECTROMETRY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0036445199     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.217.10.515.20796     Document Type: Article

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