Effect of necking on Czochralski-grown LiF crystals and its influence on crystalline perfection and the correlated physical properties

Journal of Applied Crystallography

Volumn 44, Issue 1, 2011, Pages 122-128

  Bhagavannarayana, G ^a   Kushwaha, S K ^a   Shakir, Mohd ^a   Maurya, K K ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

crystal growth; Czochralski technique; high resolution diffractometry; optical properties; rocking curves

Indexed keywords

BULK CRYSTALS; BULK SINGLE CRYSTALS; CRYSTAL REGION; CRYSTALLINE PERFECTION; CZOCHRALSKI; CZOCHRALSKI TECHNIQUE; GROWN CRYSTALS; HIGH RESOLUTION DIFFRACTOMETRY; HIGH-RESOLUTION X-RAY DIFFRACTION; HRXRD; LIF CRYSTAL; LITHIUM FLUORIDE; OPTICAL AND DIELECTRIC PROPERTIES; PHOTOLUMINESCENCE SPECTRUM; PL INTENSITY; ROCKING CURVES; SEED CRYSTAL;

COLOR CENTERS; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; CRYSTALLIZATION; DIELECTRIC PROPERTIES; DIFFRACTION; GRAIN BOUNDARIES; LITHIUM; SEMICONDUCTOR QUANTUM WELLS; SINGLE CRYSTALS; VACANCIES; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

OPTICAL PROPERTIES;

CHROMIS CINERASCENS;

EID: 79251510858     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810048879     Document Type: Article

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