A test system for complex permittivity measurements of low-loss materials at high temperatures up to 2000 °c

Measurement Science and Technology

Volumn 22, Issue 4, 2011, Pages

  Guo, Gaofeng ^a   Li, En ^a   Li, Zhongping ^b   Zhang, Qishao ^a   He, Fengmei ^b  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b AEROSPACE RESEARCH INSTITUTE OF MATERIALS AND PROCESSING TECHNOLOGY   (China)

Author keywords

complex permittivity; high temperature; low loss material; microwave measurement; short circuited line method

Indexed keywords

INDUCTION HEATING; MICROWAVE MEASUREMENT; PERMITTIVITY; PERMITTIVITY MEASUREMENT; WAVEGUIDES;

CALIBRATION METHOD; COMPLEX PERMITTIVITY; COMPLEX PERMITTIVITY MEASUREMENT; HEATING AND COOLING; HIGH TEMPERATURE; LINE METHODS; LOW LOSS MATERIAL; TEMPERATURE RANGE;

MICROWAVE CIRCUITS;

EID: 79952740453     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/4/045707     Document Type: Article

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