Single-layered porous silica films on polyethylene terephthalate substrates for antireflection coatings

Thin Solid Films

Volumn 519, Issue 11, 2011, Pages 3778-3781

  Kum, Byung Gon ^a   Park, Yoon Cheol ^a   Chang, Yong June ^a   Jeon, Jea Yong ^b   Jang, Hyun M ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b DONG A CHEM TECH Research Institute   (South Korea)

Author keywords

Antireflection; Cetyltrimethylammonium bromide; Optical properties; Polyethylene terephthalate; Porous silica; Thin film; Thin films; Wetting

Indexed keywords

ANTI-REFLECTION; AR COATINGS; ATOMIC FORCE MICROSCOPES; CETYL TRIMETHYL AMMONIUM BROMIDES; CETYLTRIMETHYLAMMONIUM BROMIDE; HIGH TEMPERATURE TREATMENTS; MOLAR RATIO; PET SUBSTRATE; POROUS SILICA; POROUS SILICA FILMS; POROUS STRUCTURES; SILICA SOLS; TEMPLATED SYNTHESIS;

AMMONIUM COMPOUNDS; BROMINE COMPOUNDS; COATINGS; CONTACT ANGLE; FILM PREPARATION; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; POLYETHYLENE TEREPHTHALATES; POLYETHYLENES; SILICA; SUBSTRATES; THERMOPLASTICS; THIN FILMS; WETTING;

ANTIREFLECTION COATINGS;

EID: 79952738344     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.163     Document Type: Article

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